Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• scanning frequency and free amplitude, and a set point of approximately 0.2, resulting in clear, high-quality AFM images. Keywords: atomic force microscopy; estimated tip diameter; scanning parameter; tip reconstruction; tip wear; Introduction AFM is a commonly used multifunctional technology in

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• of a TEM to characterize the tip limits thus limiting its broad applicability. However, it is possible that other tip characterization methods, such as blind tip reconstruction, could be applied instead. Furthermore, the results highlight a wider-ranging issue: Improved methods for modeling adhesive

Insect attachment on crystalline bioinspired wax surfaces formed by alkanes of varying chain lengths

• Elena Gorb,
• Sandro Böhm,
• Nadine Jacky,
• Louis-Philippe Maier,
• Kirstin Dening,
• Sasha Pechook,
• Boaz Pokroy and
• Stanislav Gorb

Beilstein J. Nanotechnol. 2014, 5, 1031–1041, doi:10.3762/bjnano.5.116

• mica disc covered with colloidal gold particles (5.5, 9.3, and 14.4 nm in diameter) (Pelco AFM Gold standard Kit Product No. 16205, TED Pella Inc., Redding, CA, USA). Using the SPIP software, the radius of 13 nm was determined via blind tip reconstruction. Measurements of contact angles of double